SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY SCISCIE

中文简介

光谱化学学报B部分：原子光谱学，旨在快速出版的原始工作和评论在以下领域：原子发射光谱(AES)、原子吸收光谱(AAS)和原子荧光光谱(AFS)；用于无机分析，包括火花源(SS-MS)、电感耦合等离子体(ICP-MS)、辉光放电(GD-MS)和二次离子质谱(SIMS)。激光诱导原子光谱用于无机分析，包括非线性光学激光光谱、覆盖激光增强电离(LEI)、激光诱导荧光(LIF)、共振电离光谱(RIS)和共振电离质谱(RIMS)；激光诱导击穿光谱(LIBS)；激光烧蚀电感耦合等离子体原子发射光谱(LA-ICP-AES)和激光烧蚀电感耦合等离子体质谱(LA-ICP-MS)。X射线光谱法、X射线光学及显微分析，包括X射线荧光光谱法(XRF)及相关技术，特别是全反射X射线荧光光谱法(TXRF)、同步辐射激发全反射X射线光谱法(SR-TXRF)。涉及(i)基本原理、(ii)方法发展、(iii)仪器和(iv)应用的手稿可提交出版。重点放在与“光谱化学分析”有关的论文上。主要科目将包括与产生原子或质谱有关的物理和化学过程的理论或实验研究；原子数据的测定；光谱化学源诊断；在上述光谱分析领域中使用的完整仪器系统、仪器部件或设备的基本原理、设计或性能；定性和定量分析是指用一种方法或多种方法的组合完成分析程序，或部分完成程序：抽样、制样、进样、检测、数据采集和处理(包括校准和统计评价)；分析性能和优点分析图：检测限和测定限、选择性、精密度、准确度、干扰。定期发表关于某一特别重要的主题或分析领域的权威和全面的评论文章。此外，欢迎就一个领域或专题的现况和未来前景作较短、简明的评论或观点，特别是与发展新的分析方法或更好地了解其基本基本原则有关的领域或专题。课程回顾，说明了深入的基本概念在原子光谱和分析原子光谱，也发表了。描述光谱技术在分析中的应用的文章也将被考虑。然而，在这种情况下，手稿的光谱味道应该是实质性的：不应该只提交分析配方或强调分离和预浓缩技术的论文。最后，根据编辑的自由裁量权，将考虑加快发表涉及新的重要概念、仪器发展或应用的短篇论文。

投稿网址：http://ees.elsevier.com/sab/

英文简介

Spectrochimica Acta Part B-Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.The emphasis is on papers having a relationship with "spectrochemical analysis". The main subjects will include theoretical or experimental studies of the physical and chemical processes connected with the generation of atomic or mass spectra; the determination of atomic data; diagnostics for spectrochemical sources; the fundamentals, design or performance of complete instrumental systems, components of instruments, or devices used in any of the above stated fields of spectrometry; qualitative and quantitative analysis in the sense of complete analytical procedures using a single method or a combination of methods, or parts of complete procedures: sampling, sample preparation, sample introduction, detection, data acquisition and handling (including calibration and statistical evaluation); analytical performance and analytical figures of merit: limits of detection and limits of determination, selectivity, precision, accuracy, interferences.Authoritative and comprehensive review articles, dedicated to a particularly important topic or field of analysis, are published regularly. In addition, shorter, concise reviews or viewpoints focusing on the current status and future prospects of a field or topic particularly relevant to the development of a new analytical methodology or to a better understanding of its fundamental underlying principles are welcome. Tutorial reviews, illustrating in depth fundamental concepts in atomic spectroscopy and analytical atomic spectroscopy, are also published.Articles describing an application of a spectroscopic technique to analysis will also be considered. In this case, however, the spectroscopic flavor of the manuscript should be substantial: mere analytical recipes or papers emphasizing separation and pre-concentration techniques should not be submitted. Finally, to the editors' discretion, accelerated publication of short papers dealing with new important concepts, instrumental developments or applications will be considered.