MEASUREMENT SCIE

中文简介

鼓励作者提交新颖的材料，其最终目标是提高以下方面的技术水平：测量和计量基础、传感器、测量仪器、测量和估计技术、测量数据处理和融合算法；工厂和工业过程的评价程序和方法，系统、过程和算法的性能分析，面向测量目的的数学模型，连接世界的分布式测量系统。

投稿网址：http://ees.elsevier.com/meas/

英文简介

Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.