MICROELECTRONICS JOURNAL SCIE

中文简介

《微电子杂志》自1969年出版以来，是一个国际论坛，旨在传播微电子系统、电路和新兴技术的研究和应用。发表在《微电子杂志》上的论文都经过同行评审，以确保原创性、相关性和及时性。因此，该杂志提供了一份关于微电子电路和系统的全球、定期和全面的更新。《微电子杂志》邀请发表论文，介绍在以下所有领域的重要研究和应用。还将考虑涵盖最新发展的全面审查/调查文件。《微电子杂志》涵盖了电路和系统。本主题包括但不限于?模拟、数字、混合和射频电路及相关设计方法?逻辑、架构和系统级综合?测试、可测试性设计、内置自检?面积、功率和热分析和设计?混合域模拟和设计?嵌入式系统?非冯诺依曼计算及相关技术和电路?设计和测试高复杂性系统集成?SOC、NOC、SIP和NIP设计和测试?三维集成设计与分析?新兴设备技术和电路，如场效应晶体管、集合、自旋电子学、SFQ、MTJ等。信号和图像处理等应用方面，包括密码电路、传感器和执行器（包括传感器网络）、可靠性和质量问题以及经济模型也受到欢迎。

投稿网址：http://ees.elsevier.com/mej/

英文简介

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to? Analog, digital, mixed, and RF circuits and related design methodologies? Logic, architectural, and system level synthesis? Testing, design for testability, built-in self-test? Area, power, and thermal analysis and design? Mixed-domain simulation and design? Embedded systems? Non-von Neumann computing and related technologies and circuits? Design and test of high complexity systems integration? SoC, NoC, SIP, and NIP design and test? 3-D integration design and analysis? Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.